By Gordon Roberts, Friedrich Taenzler, Mark Burns

ISBN-10: 0199796211

ISBN-13: 9780199796212

With the proliferation of advanced semiconductor units containing electronic, analog, mixed-signal, and radio-frequency circuits, brand new engineer needs to be fluent in all 4 circuit forms. Written for complicated undergraduate and graduate-level scholars, in addition to engineering execs, An Introduction to Mixed-Signal IC try out and Measurement, moment variation, encompasses analog, mixed-signal and radio-frequency circuits assessments, with many correct commercial examples. The textual content assumes an excellent historical past in analog and electronic circuits and a operating wisdom of pcs and computing device programming.

An advent to Mixed-Signal IC attempt and Measurement, moment version, comprises examples and illustrations--featuring state of the art commercial technology--to improve and liven up the textual content. The e-book additionally introduces large-scale mixed-signal circuit and person circuit checks, discusses the value-added advantages of mixed-signal IC trying out to a manufacturer's product, and obviously defines the function of the attempt engineer.

New to This Edition
* a brand new bankruptcy on RF attempt tools and basics of RF Testing
* a brand new bankruptcy on Clock and Serial info Communications Channel Measurements
* assurance of RF load board design
* New insurance of probabilistic reasoning for mixed-signal trying out

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Extra info for An Introduction to Mixed-Signal IC Test and Measurement

Example text

They have no hardwired connections to tester instruments. Therefore, the purpose and functionality of a general-purpose relay matrix depends on the test engineer’s DIB design. It allows flexible interconnections between specific tester instruments and pins of the DUT through connections on the DIB board. 4. Instrument relay matrix. DIB connections Voltmeter + Voltmeter – DC source 1 DC source 2 DC source 3 DC source 4 D i g i t i ze r 1 Etc… Chapter 2 • Tester Hardware the DIB board. The exact architecture of relays, matrices, and signal paths varies widely from one ATE vendor’s tester to the next.

The test engineer’s role is to generate hardware and software that will be used by automated test equipment (ATE) to guarantee the performance of each device after it is fabricated. The test software directs the ATE tester to apply a variety of electrical stimuli (such as digital signals and sine waves) to the device under test (DUT). 8). A typical mixed-signal DUT must pass hundreds or even thousands of stimulus/response tests before it can be shipped to the customer. 8. Test stimulus and DUT response verification.

Design engineers point out deficiencies in the proposed test coverage while product engineers point out any problems that may arise on the production floor. Once the test plan has been approved, the test engineer begins to design the necessary test interface hardware that will connect the automated test equipment to the device under test. Once the initial test hardware has been designed, the test engineer begins writing a test program that will run on the ATE tester. In modern ATE equipment, the test engineer can also debug many of the software routines in the test program before silicon arrives, using an offline simulation environment running on a stand-alone computer workstation.

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An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns

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